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yokogawa AQ6374 短波长光谱分析仪
World-Class Optical Performance
- Wavelength range: 350 to 1750nm
- High wavelength accuracy: ±0.05nm
- High wavelength resolution: 0.05 to 10 nm
- Wide dynamic range: 60dB (peak ±1.0nm)
- Wide level range: +20 to -80dBm
- Fast measurement: 0.5 sec. (100nm span)
Wavelength Resolution Settings:
There are 8 wavelength resolution settings: 0.05 to 10 nm
to enable the user to choose the best value according to the
device/system under test.
Measurable Level Range:
The wide measurable level range is from−80 to +20 dBm. This is suitable to measure high power as well as low power sources used in different fields of application.
Wavelength accuracy:
The ±0.05 nm wavelength accuracy can be maintained by the calibration using the built-in reference light source or an external light source including HeNe laser and Argon light source.
Fast measurement:
The instrument takes only 0.5 s for 100 nm span (with sensitivity set to NORM_AUTO).
Number of sampling: 100001
The number of wavelength samples has been doubled. One sweep can measure a wider wavelength range at high resolution.
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